HP/Agilent 3070 Series ATE Test Equipment

The HP/Agilent 3070 Series test systems provide a wide variety of board testing capabilities. These systems perform in-circuit, functional, or combinational testing on digital, analog and hybrid circuit boards.

Features:
High Speed Testing: Rate: Up to 20 million / sec.
High Speed Clocks: 625 kHz to 80 MHz
Digital Functional Testing Tools
Timing sets

Powered Testing:
Digital Component Testing Library-based
digital in-circuit
component testing.
5184 hybrid nodes maximum
6.25 million Patterns per second
625 kHz to 20 MHz clocks
Flash RAM programming capability
Boundary-scan testing

Unpowered Testing:
Maximum System Capacity: 5184
Opens Testing: Circuit opens detected with
Agilent Test Jet* technology
Shorts Testing: Automatic test with
Programmable threshold

Test Methods:
Shorts & open
Analog in-circuit
Analog functional
Mixed analog & digital
Digital functional
Boundary-scan

Analog Functional Testing:
Library and user-developed testing of Op-amps, comparators, voltage regulators, ect.

Digital Component Testing:
Library-based digital in-circuit
component testing
5184 hybrid nodes maximum
6.25 million patterns per second
625 kHz to 20 MHz clocks
Flash RAM programming capability
Boundary-scan testing

Analog Component Testing:
Resistance, capacitance and inductance.
Polarity verification on polarized SMT and axial capacitors.
Special tests for diodes, zener diodes, transistors, FETs, jumpers, switches and potentiometers.

For More Information Contact Sales Department:
Phone: 603-880-7355
e-mail: sales@v-ne.com